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Electrical characterization of the soft breakdown failure mode in MgO layers
E. Miranda, E. O’connor, K. Cherkaoui, S. Monaghan, R. Long, D. O’connell, P. K. Hurley, G. Hughes, P. CaseyYear:
2009
Language:
english
DOI:
10.1063/1.3167827
File:
PDF, 433 KB
english, 2009