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Extended X-ray absorption fine structure spectroscopy of selenium-hyperdoped silicon
Newman, Bonna K., Ertekin, Elif, Sullivan, Joseph T., Winkler, Mark T., Marcus, Matthew A., Fakra, Sirine C., Sher, Meng-Ju, Mazur, Eric, Grossman, Jeffrey C., Buonassisi, TonioVolume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4824279
File:
PDF, 1.40 MB
english, 2013