[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - Substrate-current-induced hot electron (SCIHE) injection: a new convergence scheme for flash memory
Hu, C.-Y., Kencke, D.L., Banerjee, S.K., Richart, R., Bandyopadhyay, B., Moore, B., Ibok, E., Garg, S.Year:
1995
Language:
english
DOI:
10.1109/iedm.1995.499197
File:
PDF, 415 KB
english, 1995