[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration
Narayanan, Pritish, Leuchtenburg, Michael, Kina, Jorge, Joshi, Prachi, Panchapakeshan, Pavan, Chui, Chi On, Moritz, C. AndrasYear:
2010
Language:
english
DOI:
10.1109/dft.2010.10
File:
PDF, 422 KB
english, 2010