[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA,...

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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures

Devarakond, Shyam Kumar, Sen, Shreyas, Bhattacharya, Soumendu, Chatterjee, Abhijit
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Year:
2010
Language:
english
DOI:
10.1109/vts.2010.5469536
File:
PDF, 699 KB
english, 2010
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