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[Institute of Electrical and Electronics Engineers 1986 IEEE International Solid-State Circuits Conference - Anaheim, CA, USA (February 1986)] 1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A 1Mb CMOS DRAM with design-for-test functions
Neal, J., Holland, B., Inoue, S., Wah Loh,, McAdams, H., Ken Poteet,Volume:
XXIX
Year:
1986
Language:
english
DOI:
10.1109/isscc.1986.1156947
File:
PDF, 572 KB
english, 1986