Elaboration of a biased random walk model with a high spatial resolution for the simulation of the microorganisms exposure to gradient stress in scale-down reactors
F. Delvigne, J. Destain, P. ThonartVolume:
39
Year:
2008
Language:
english
Pages:
10
DOI:
10.1016/j.bej.2007.08.019
File:
PDF, 625 KB
english, 2008