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[IEEE Conference Record. AUTOTESTCON '96 - Dayton, OH, USA (16-19 Sept. 1996)] Conference Record. AUTOTESTCON '96 - Test and maintenance information management standard
Haynes, L., Levy, R., Chujen Lin,, Prasad, P.Year:
1996
Language:
english
DOI:
10.1109/autest.1996.547730
File:
PDF, 678 KB
english, 1996