Determination of the composition and thickness of...

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Determination of the composition and thickness of borophosphosilicate glass films by infrared ellipsometry

R. Ossikovski, N. Blayo, B. Drévillon, M. Firon, B. Delahaye, A. Mayeux
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Year:
1994
Language:
english
DOI:
10.1063/1.112081
File:
PDF, 632 KB
english, 1994
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