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[IEEE 2010 International Conference on Manufacturing Automation (ICMA) - Hong Kong, China (2010.12.13-2010.12.15)] 2010 International Conference on Manufacturing Automation - Research on Fault Diagnosis Based on Wavelet Packet Multi-class Classification SVM
Xu, Xiaogang, Wang, Songling, Li, Fei, Wu, Zhengren, Sun, WeiYear:
2010
Language:
english
DOI:
10.1109/icma.2010.41
File:
PDF, 1.43 MB
english, 2010