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by ion-beam sputter deposition: In situ x-ray photoelectron spectroscopy as a function of oxygen partial pressure and deposition temperature
Kim, Kyung Joong, Kim, Jeong Won, Yang, Moon-Seung, Shin, Jung HoonVolume:
74
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.74.153305
Date:
October, 2006
File:
PDF, 85 KB
english, 2006