[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - Discriminatory learning based performance monitoring of batch processes
Patel, Shailesh, Yelchuru, Ramprasad, Ryali, Srikanth, Gudi, RavindraYear:
2011
Language:
english
DOI:
10.1109/acc.2011.5991024
File:
PDF, 337 KB
english, 2011