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Empirical characteristics of tunnel junctions for X-ray detection
Ishibashi, K., Kishimoto, T., Maehata, K., Hashimoto, M., Matsumoto, Y.Volume:
7
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.622097
Date:
June, 1997
File:
PDF, 504 KB
english, 1997