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[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - On-chip in-situ measurements of Vth and AC gain of differential pair transistors
Bando, Yoji, Takaya, Satoshi, Ohkawa, Toru, Takaramoto, Toshiharu, Yamada, Toshio, Souda, Masaaki, Kumashiro, Shigetaka, Nagata, MakotoYear:
2010
Language:
english
DOI:
10.1109/icmts.2010.5466809
File:
PDF, 842 KB
english, 2010