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[IEEE 5th IEEE Conference on Nanotechnology, 2005. - Nagoya, Japan (July 11-15, 2005)] 5th IEEE Conference on Nanotechnology, 2005. - Effects of dot height uniformity on the performance of 1.3 μm InAs quantum dot lasers
Wei-Sheng Liu,, Holin Chang,, Jen-Inn Chyi,Year:
2005
Language:
english
DOI:
10.1109/nano.2005.1500648
File:
PDF, 330 KB
english, 2005