[IEEE 2009 IEEE International Ultrasonics Symposium - Rome,...

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[IEEE 2009 IEEE International Ultrasonics Symposium - Rome, Italy (2009.09.20-2009.09.23)] 2009 IEEE International Ultrasonics Symposium - Resonant LGS microsensor for scanning microdeformation microscopy

Douchet, G., Sthal, F., Bigler, E., Leblois, T., Vairac, P.
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Year:
2009
Language:
english
DOI:
10.1109/ultsym.2009.5441465
File:
PDF, 1.67 MB
english, 2009
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