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[IEEE 2014 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Columbus, OH, USA (2014.6.23-2014.6.28)] 2014 IEEE Conference on Computer Vision and Pattern Recognition Workshops - Natural vs Artificial Face Classification Using Uniform Local Directional Patterns and Wavelet Uniform Local Directional Patterns
DSouza, Darryl, Yampolskiy, Roman V.Year:
2014
Language:
english
DOI:
10.1109/cvprw.2014.10
File:
PDF, 1.53 MB
english, 2014