[IEEE 53rd Electronic Components and Technology Conference, 2003. - New Orleans, Louisiana, USA (May 27-30, 2003)] 53rd Electronic Components and Technology Conference, 2003. Proceedings. - RF PA module substrate via reliability
Darveaux, R., Jicheng Yang,, Sheridan, R., Buella, B., Villareal, P.Рік:
2003
Мова:
english
DOI:
10.1109/ectc.2003.1216442
Файл:
PDF, 734 KB
english, 2003