LiAl: Electrical resistivity and Li diffusion
Sugai, Hiroyuki, Tanase, M., Yahagi, M., Ashida, T., Hamanaka, H., Kuriyama, K., Iwamura, K.Volume:
52
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.52.4050
Date:
August, 1995
File:
PDF, 440 KB
english, 1995