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[IEEE Workshop on Low Temperature Semiconductor Electronics - Burlington, VT, USA (7-8 Aug. 1989)] Proceedings of the Workshop on Low Temperature Semiconductor Electronics - A numerical study of the temperature dependence of the unity gain frequency of silicon bipolar transistors
Chrzanowska-Jeske, M., Jaeger, R.C.Year:
1989
Language:
english
DOI:
10.1109/ltse.1989.50177
File:
PDF, 272 KB
english, 1989