Proximity effects of negative charge groups contact-electrified on thin silicon oxide in air
Uchihashi, Takayuki, Okusako, Takahiro, Sugawara, Yasuhiro, Yamanishi, Yoshiki, Oasa, Takahiko, Morita, SeizoVolume:
79
Year:
1996
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.361784
File:
PDF, 397 KB
english, 1996