[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - DLTS and capacitance transients study of defects induced by neutron irradiation in MOS structures CCD process
Ahaitouf, A., Losson, E., Charles, J.-P.Year:
2000
Language:
english
DOI:
10.1109/radecs.1999.858636
File:
PDF, 375 KB
english, 2000