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[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Applications of scanning near-field photon emission microscopy
Isakov, D.V., Tan, B.W.M., Phang, J.C.H., Yeo, Y.C., Tio, A.A.B., Zhang, Y., Geinzer, T., Balk, L.J.Year:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232566
File:
PDF, 5.39 MB
english, 2009