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Evaluation of defects in cuprous oxide through exciton luminescence imaging
Frazer, Laszlo, Lenferink, Erik J., Chang, Kelvin B., Poeppelmeier, Kenneth R., Stern, Nathaniel P., Ketterson, John B.Volume:
159
Language:
english
Journal:
Journal of Luminescence
DOI:
10.1016/j.jlumin.2014.11.035
Date:
March, 2015
File:
PDF, 1.96 MB
english, 2015