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studied by oblique-incidence polarized-reflectivity measurements
Kim, Jae H., Feenstra, B. J., Somal, H. S., van der Marel, D., Lee, Wen Y., Gerrits, A. M., Wittlin, A.Volume:
49
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.49.13065
Date:
May, 1994
File:
PDF, 237 KB
english, 1994