[IEEE IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium - Honolulu, HI, USA (2010.07.25-2010.07.30)] 2010 IEEE International Geoscience and Remote Sensing Symposium - Statistics for characterizing data on the periphery
Theiler, James, Hush, DonYear:
2010
Language:
english
DOI:
10.1109/igarss.2010.5651361
File:
PDF, 400 KB
english, 2010