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[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - 1.9 picosecond optical temporal analyzer using 1.2 picosecond photodetector and gate
Chen, Y., Williamson, S.L., Brock, T., Smith, F.W.Year:
1991
Language:
english
DOI:
10.1109/iedm.1991.235366
File:
PDF, 387 KB
english, 1991