Measurement of Microwave Dielectric Properties of...

Integrated Ferroelectrics 2004 / 01 Vol. 66; Iss. 1

Measurement of Microwave Dielectric Properties of (Sr,Ba)Nb 2 O 6 Thin Films

MOON, SEUNG EON, KWAK, MIN HWAN, KIM, YOUNG-TAE, RYU, HAN-CHEOL, LEE, SU-JAE, KANG, KWANG-YONG
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Volume:
66
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580490895680
Date:
January, 2004
File:
PDF, 428 KB
english, 2004
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