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Observation of double-gap-edge Andreev reflection at Si/Nb interfaces by point-contact spectroscopy
Heslinga, D. R., Shafranjuk, S. E., van Kempen, H., Klapwijk, T. M.Volume:
49
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.49.10484
Date:
April, 1994
File:
PDF, 524 KB
english, 1994