![](/img/cover-not-exists.png)
[IEEE Comput. Soc. Press IEEE International Computer Performance and Dependability Symposium - Urbana-Champaign, IL, USA (4-6 Sept. 1996)] Proceedings of IEEE International Computer Performance and Dependability Symposium - The DIN method: a new approach for measuring and rating data processing performance
Dirlewanger, W.Year:
1996
Language:
english
DOI:
10.1109/ipds.1996.540221
File:
PDF, 890 KB
english, 1996