[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects
Chun, Sunghoon, Kim, Yongjoon, Kang, SunghoYear:
2007
Language:
english
DOI:
10.1109/ats.2007.58
File:
PDF, 324 KB
english, 2007