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[IEEE 2006 IEEE International Symposium on Circuits and Systems - Island of Kos, Greece (21-24 May 2006)] 2006 IEEE International Symposium on Circuits and Systems - Linearity Test for High Resolution DACs Using Low-Accuracy DDEM Flash ADCs
Hanqing Xing,, Degang Chen,, Geiger, R.Year:
2006
Language:
english
DOI:
10.1109/iscas.2006.1693123
File:
PDF, 1.47 MB
english, 2006