Entropy of ionization and temperature variation of...

Physical Review B 1976 / 10 Vol. 14; Iss. 8

Entropy of ionization and temperature variation of ionization levels of defects in semiconductors

Van Vechten, J. A., Thurmond, C. D.
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Volume:
14
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.14.3539
Date:
October, 1976
File:
PDF, 1.53 MB
english, 1976
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