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Experimental evidence and modeling of two types of electron traps in Al2O3 for nonvolatile memory applications
Sambuco Salomone, L., Lipovetzky, J., Carbonetto, S. H., García Inza, M. A., Redin, E. G., Campabadal, F., Faigón, A.Volume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4792038
File:
PDF, 1.11 MB
english, 2013