Structural and Reliability Analysis of Ohmic Contacts to...

ECS Journal of Solid State Science and Technology 2012 / 01 Vol. 1; Iss. 1

Structural and Reliability Analysis of Ohmic Contacts to SiC with a Stable Protective Coating for Harsh Environment Applications

Daves, W., Krauss, A., Haublein, V., Bauer, A. J., Frey, L.
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Volume:
1
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.019201jss
Date:
January, 2012
File:
PDF, 1.90 MB
english, 2012
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