[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure analysis of TaN thin film resistors for microwave circuits
Qiantao Cao,, Zhiming Song,, Fei Wang,, Bin Wang,, Zhenguo Song,, Yinglu Hu,Year:
2013
Language:
english
DOI:
10.1109/ipfa.2013.6599269
File:
PDF, 704 KB
english, 2013