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[IEEE 2010 7th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE 2010) (Formerly known as ICEEE) - Tuxtla Gutierrez, Mexico (2010.09.8-2010.09.10)] 2010 7th International Conference on Electrical Engineering Computing Science and Automatic Control - Optical characterization of integrated P+/N-Well/P-substrate and N-Well/P-substrate photo-device structures on CMOS technology
Castillo-Cabrera, G., Garcia-Lamont, J., Reyes-Barranca, M. A., Moreno-Cadenas, J. A., Escobosa-Echavarria, A.Year:
2010
Language:
english
DOI:
10.1109/iceee.2010.5608563
File:
PDF, 770 KB
english, 2010