Copper-related defects in silicon:...

Physical Review B 1997 / 8 Vol. 56; Iss. 8

Copper-related defects in silicon: Electron-paramagnetic-resonance identification

Hai, P. N., Gregorkiewicz, T., Ammerlaan, C. A. J., Don, D. T.
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Volume:
56
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.56.4620
Date:
August, 1997
File:
PDF, 147 KB
english, 1997
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