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Au/Si(111): Analysis of the (√3 × √3 ) R 30° and 6×6 structures by in-plane x-ray diffraction
Dornisch, D., Moritz, W., Schulz, H., Feidenhans’l, R., Nielsen, M., Grey, F., Johnson, R. L.Volume:
44
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.44.11221
Date:
November, 1991
File:
PDF, 469 KB
english, 1991