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Failure of semiclassical models to describe resistivity of nanometric, polycrystalline tungsten films
Choi, Dooho, Liu, Xuan, Schelling, Patrick K., Coffey, Kevin R., Barmak, KatayunVolume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4868093
Date:
March, 2014
File:
PDF, 954 KB
english, 2014