![](/img/cover-not-exists.png)
[IEEE 2007 IEEE/MTT-S International Microwave Symposium - Honolulu, HI, USA (2007.06.3-2007.06.8)] 2007 IEEE/MTT-S International Microwave Symposium - Drain-Source Symmetric Artificial Neural Network-Based FET Model with Robust Extrapolation Beyond Training Data
Xu, Jianjun, Gunyan, Daniel, Iwamoto, Masaya, Horn, Jason M., Cognata, Alex, Root, David E.Year:
2007
Language:
english
DOI:
10.1109/mwsym.2007.380244
File:
PDF, 1.74 MB
english, 2007