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On the origin of basal stacking faults in nonpolar wurtzite films epitaxially grown on sapphire substrates
Vennéguès, P., Chauveau, J. M., Bougrioua, Z., Zhu, T., Martin, D., Grandjean, N.Volume:
112
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4768686
File:
PDF, 2.79 MB
english, 2012