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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Should Illinois-scan based architectures be centralized or distributed?
Al-Yamani, A., Devta-Prasanna, N., Gunda, A.Year:
2005
Language:
english
DOI:
10.1109/dftvs.2005.59
File:
PDF, 372 KB
english, 2005