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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Product-Level Reliability Estimator with advanced CMOS technology
Jae-Gyung Ahn,, Ming Feng Lu,, Ping-Ching Yeh,, Chang, J., Xin Wu,, Pai, S. Y.Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6532107
File:
PDF, 365 KB
english, 2013