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Deep-level transient spectroscopy and electrical characterization of ion-implanted p-n junctions into undoped InP
Martin, Jaime M., García, S., Mártil, I., González-Díaz, G., Castán, E., Dueñas, S.Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.359710
File:
PDF, 901 KB
english, 1995