Polarization microscopy probe for applications in a high...

Polarization microscopy probe for applications in a high magnetic field

Konijnenberg, Peter J., Ziemons, Arndt, Molodov, Dmitri A., Gottstein, Günter
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Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2829155
File:
PDF, 573 KB
english, 2008
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