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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - A frequency measurement BIST implementation targeting gigahertz application
Dubois, Matthieu, De Foucauld, Emeric, Mounet, Christopher, Dia, Serigne, Mayor, CedricYear:
2012
Language:
english
DOI:
10.1109/test.2012.6401588
File:
PDF, 1.93 MB
english, 2012