Profile structures of very thin multilayers by x-ray...

Physical Review B 1986 / 10 Vol. 34; Iss. 8

Profile structures of very thin multilayers by x-ray diffraction using direct and refinement methods of analysis

Skita, Victor, Filipkowski, Mark, Garito, Anthony F., Blasie, J. Kent
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Volume:
34
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.34.5826
Date:
October, 1986
File:
PDF, 1.32 MB
english, 1986
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