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[IEEE Control (MSC) - Yokohama, Japan (2010.09.8-2010.09.10)] 2010 IEEE International Conference on Control Applications - Dynamic topology optimization for dependable sensor networks
Iino, Yutaka, Hatanaka, Takeshi, Fujita, MasayukiYear:
2010
Language:
english
DOI:
10.1109/cca.2010.5611151
File:
PDF, 322 KB
english, 2010