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[IEEE IVESC 2004. The 5th International Vacuum Electron Sources - Beijing, China (6-10 Sept. 2004)] IVESC 2004. The 5th International Vacuum Electron Sources Conference Proceedings (IEEE Cat. No.04EX839) - Applications of electron sources and other influence of process parameter on the cathode characteristics during CRT manufacturing
Kuo-Ching Chou,, Hsiang-Lin Chang,, Chun-Hsien Yeh,Year:
2004
Language:
english
DOI:
10.1109/ivesc.2004.1414246
File:
PDF, 134 KB
english, 2004